| dc.contributor.author |
Lourenço, T.
|
pt_BR |
| dc.contributor.author |
Matias, L.
|
pt_BR |
| dc.contributor.author |
Faria, P.
|
pt_BR |
| dc.date.accessioned |
2017-06-22T10:53:24Z |
pt_BR |
| dc.date.accessioned |
2017-08-09T09:58:07Z |
|
| dc.date.available |
2017-06-22T10:53:24Z |
pt_BR |
| dc.date.available |
2017-08-09T09:58:07Z |
|
| dc.date.issued |
2017-09 |
pt_BR |
| dc.identifier.citation |
https://doi.org/10.1016/j.conbuildmat.2017.05.052 |
pt_BR |
| dc.identifier.uri |
https://repositorio.lnec.pt/jspui/handle/123456789/1009604 |
|
| dc.description.abstract |
Adherent tiling systems are widely used all over the world as wall cladding because of their aesthetic and
technical characteristics. However, anomalous behaviours often occur; compromising the overall behaviour
of facades, and possibly raising safety risks. The need to create expeditious, non-destructive and
accurate methods of inspection that can encourage these systems’ inspection and maintenance fomented
a research study on infrared thermography’s capacity of early detect anomalous zones in adhesive tiling
systems, such as detachments or presence of humidity, in controlled in situ conditions, proving it as a
valuable diagnostic tool. |
pt_BR |
| dc.language.iso |
eng |
pt_BR |
| dc.publisher |
Elsevier |
pt_BR |
| dc.rights |
openAccess |
pt_BR |
| dc.subject |
Wall tiling system |
pt_BR |
| dc.subject |
Anomaly detection detachment |
pt_BR |
| dc.subject |
Infrared thermography |
pt_BR |
| dc.subject |
NDT |
pt_BR |
| dc.title |
Anomalies detection in adhesive wall tiling systems by infrared thermography |
pt_BR |
| dc.type |
article |
pt_BR |
| dc.description.pages |
10p |
pt_BR |
| dc.description.comments |
Artigo de Livre Acesso |
pt_BR |
| dc.description.volume |
148 |
pt_BR |
| dc.description.sector |
DED/NRI |
pt_BR |
| dc.identifier.proc |
0803/112/20187 |
pt_BR |
| dc.description.magazine |
Construction & Building Materials |
pt_BR |
| dc.contributor.peer-reviewed |
SIM |
pt_BR |
| dc.contributor.academicresearchers |
SIM |
pt_BR |
| dc.contributor.arquivo |
SIM |
pt_BR |